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[供应]litepoint IQ2010无线连接测试仪出售 出租IQ2010
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  • 产品产地:美国
  • 产品品牌:莱特波特
  • 包装规格:IQ2010
  • 产品数量:2
  • 计量单位:台
  • 产品单价:10000
  • 更新日期:2018-03-06 17:08:39
  • 有效期至:2019-03-06
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litepoint IQ2010无线连接测试仪出售 出租IQ2010 详细信息

本公司专业经营各类二手进口仪器(销售、租赁、维修、回收等业务),成色新,价格低,技术先进、质量可靠、性能稳定的优良产品。长期承接销售、租赁、维修、回收二手高档仪器, 包括Agilent、HP、Anritsu、Advantest、R/S、/MARCONI等世界知名品牌的网络分析仪、频谱分析仪、综合测试仪、数字通讯测试仪、高频信号源、数字示波器、天馈线测试仪、电声测试仪,音频分析仪等二手高频通讯测试仪器仪表的销售及租赁业务。如果你遇到困难,我们都将全力以付的为你们提供最佳的方案。

Testing Multi-Radio Devices in Manufacturing

Single devices with multiple radios and wireless standards pose a significant challenge for manufacturing testing. Ordinarily, each standard is tested one after another, and test times and costs balloon upward. The challenge for you is to test multiple radios and standards in the time it now takes you to test one or two, and that’s precisely what LitePoint’s IQ2010 is designed to do.

Before the IQ2010, to test multi-radio devices, most manufacturers relied on separate lines of single-radio test systems. Multi-radio devices are moved from line to line, and inserted again and again. If one is testing four radios and their underlying standards, it may require four lines and four different test systems. So, equipment cost is high, and insertion-damage risk compounds that cost.

LitePoint’s IQ2010 Multicom™ TesterWith LitePoint’s IQ2010, a single system, you can test six different radios and standards. The standard model comes ready to test four popular radios and standards – WiFi, GPS, FM and Bluetooth. But, as needs dictate, you can add WiMAX and NFC, in the field, via a software licensing key.

LitePoint’s IQ2010 Multicom Test System attacks two key manufacturing-test obstacles: test time and equipment costs. Your test time is affected by the length of individual tests, and by having to do them in a series. The IQ2010 provides you with some test concurrency, which shortens overall test time, and a technology called “sequence-based testing” or SBT, which markedly reduces the number of communications transactions between your tester and device-under-test (DUT). These two features can reduce test time and test cost dramatically.    2010 demo.  And, by having a single system that does the work of four systems, you save on equipment costs.

For more information, see the  brochure  and  datasheet.

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